Atomic Force Microscope

A probe with a sharp tip is moved over a surface. Interactive forces between the surface and the tip are measured and can be analyzed to measure surface properties such as topography, certain chemical features, charge, stiffness ...

Model / producer: MFP 3D; Asylum Research, Santa Barbara, CA, USA - specifications can be found here.

Manufacturer's information about the microscope

 

Tags: Atomic Force Microscope, Microscope
Published Sep. 4, 2012 4:09 PM - Last modified Nov. 7, 2013 3:30 PM