Tabletop Microscope (SEM)
Scanning electron microscop for surface characterisation: Stunning imaging and optional elemental analysis.
The machine allows surface morphology assessment due to different average atomic number composition within the sample. Elemental surface analysis via EDS measurements possible.
Main advantages: Ease of use and quick accessibility.
Machine model: Hitachi Analytical TableTop Microscope / Benchtop SEM TM3030
For those applications requiring more than "just" imaging, TM3030 offers the possibility to integrate an EDS system for full-scale elemental analysis of samples. The working distances for observation and EDX analysis are the same (8.5mm), so switching from viewing of an interesting feature to its elemental analysis is possible immediately without any adjustment or risk to loose the site of interest.
With the TM3000 series, besides point analysis, also line scans and even elemental distributrion mappings (spectral imaging) are possible in short time due to the high probe currents available. Like everything in the TM3030, elemental analysis is easy - readily available even to novice users within a few mouse clicks. The charge reduction features of the TM3030 effectively prevent sample drift during not only imaging but also analytical work.