The Nikon XT H 225 ST is a versatile microfocus X-ray Computed Tomography (CT) system designed for high-resolution inspection of components ranging from small plastic connectors to medium-sized aluminum castings. It is widely used in research and development, failure analysis, and production quality control.
Key Features:
- High-Power X-ray Source: The system is equipped with a 225 kV microfocus X-ray source, allowing for detailed imaging of various materials, including metals and composites. The maximum power output is 225 W, providing the capability to penetrate dense samples.
- High-Resolution Imaging: With voxel sizes ranging from 5 to 100 micrometers, the XT H 225 ST delivers high-resolution 3D imaging, enabling precise internal structure analysis of specimens.
- Flexible Sample Accommodation: The system can handle samples up to 180 mm in diameter and 300 mm in height, with a maximum weight of 15 kg, making it suitable for a wide range of applications.
- Advanced Detector Technology: It features a 16-bit detector with a resolution of 2880 x 2880 pixels, ensuring high-quality image capture for detailed analysis.
Applications:
The XT H 225 ST is suitable for a variety of applications, including:
- Industrial Inspection: Non-destructive testing of components for defects, porosity, and internal structures.
- Material Research: Analysis of composite materials, metals, and other substances to study internal features and integrity.
- Quality Control: Inspection of manufactured parts to ensure they meet required specifications and standards.
- Failure Analysis: Investigation of failed components to determine the root cause of failure by examining internal structures.
The Nikon XT H 225 ST is installed at the Natural History Museum and is part of the GeoLab.
Lab Manager: Nélia Castro