Atomic Force Microscope

The AFM has three major abilities: force measurement, imaging, and manipulation.

A probe with a sharp tip is moved over a surface. Interactive forces between the surface and the tip are measured and can be analyzed to measure surface properties such as:

  • topography
  • certain chemical features
  • charge
  • stiffness

Model / producer: MFP 3D; Asylum Research, Santa Barbara, CA, USA

AFM model MFP 3D Surface analysis in the nano meter range

 

 

 

 

 

 

For more information, contact Florian Weber

Tags: Surface Analysis, Atomic Force Microscope, Microscope
Published Sep. 4, 2012 4:09 PM - Last modified Dec. 7, 2018 3:14 PM