Atomic Force Microscope

Operating Modes¹

DContact Mode: Imaging using feedback on deflection. Height, deflection, and lateral force signals available.
AC and Dual AC™: Q-controlled imaging using feedback on amplitude. Signals include height, amplitude/phase, I/Q, deflection; both air and fluid.
Force Mode: Force curve acquisition in contact or AC mode. All signals available.
Lateral Force: Frictional force imaging.
MicroAngelo: Built-in nanolithography/ nanomanipulation.
EFM
Surface Potential
Conductive AFM (CAFM) with ORCA™ (optional)
Magnetic Force Microscopy (MFM)
Variable Field MFM (optional)
Piezoresponse Force Microscopy
Vector PFM
Switching Spectroscopy PFM (high voltage optional)
Scanning Kelvin Probe Microscopy (SKPM)
Nanoindentation (optional)
Dual AC Resonance Tracking (DART)
Thermal Analysis (optional)

Please refer to the manufactures webside for further details.

Sources and links:

¹Asylum Research

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